Experimental subshell vacancies in a multiply ionised Sn atom by heavy ion impact

Carington Masekane, Masedi; Bogdanović Radović, Ivančica; Božičević Mihalić, Iva; Mioković, Anja; Moloi, Sabata Jonas; Msimanga, Mandla; Fazinić, Stjepko (2024) Experimental subshell vacancies in a multiply ionised Sn atom by heavy ion impact. Radiation Physics and Chemistry, 226 . ISSN 0969-806X

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Abstract

The adoption of Heavy Ion PIXE for elemental quantification remains limited by the lack of fundamental atomic parameters needed for the calculation of X-ray production cross section data. Widely adapted theoretical models used for approximating ionisation cross sections, as well as other atomic physical parameters such as X-ray fluorescence yields, are calculated based on single-hole vacancy production post ion-atom impact. This renders the use of conventional 'protonic' models invalid for heavy ion-atom collisions. The degree to which Multiple Ionisation (MI) manifests in different heavy ion-atom collision symmetries significantly modifies atomic physical parameters. This is due to the significant number of introduced spectator vacancies in higher subshells, especially where near-symmetry is approached and MI is more pronounced. Knowledge of the mean number of vacancies in upper subshells is thus important for modifying atomic parameters that are needed for the translation of ionisation to X-ray production cross sections. In the present study, MI effects for Sn L-shell X-rays were studied using characteristic X-ray energy shifts measured using a standard PIXE spectrometer induced by Si, Cu and I projectile ions with incident energies up to 0.75 MeV/u. MI satellite distributions were studied using a Wavelength dispersive X-ray spectrometer (WDS) for high resolution PIXE, induced by C and Si projectile ions with incident ion energies up to 1.25 MeV/u. The mean number of subshell vacancies in the M- and N- shell for energy shifted Sn L alpha X-ray lines were determined using both standard and high resolution PIXE spectrometers.

Item Type:	Article
Uncontrolled Keywords:	Multiple Ionisation; Heavy ion PIXE; High resolution PIXE; X-ray fluorescence; Ion beam analysis
Subjects:	NATURAL SCIENCES > Physics NATURAL SCIENCES > Physics > Nuclear Physics
Divisions:	Division of Experimental Physics
Projects:	Project title Project leader Project code Project type Visoko razlučiva spektrometrija x-zraka fokusiranim ionskim snopovima-Hi-REXS Stjepko Fazinić; Dony Domagoj Cosic; Marin Vukšić; Domagoj Mudronja; Vladan Desnica; John Campbell IP-2019-04-9429 HRZZ
Depositing User:	Dr. Masedi C. Masekane
Date Deposited:	28 Jan 2025 07:51
URI:	http://fulir.irb.hr/id/eprint/9448
DOI:	10.1016/j.radphyschem.2024.112211

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