Ellipsometry-based study of glass refractive index depth profiles obtained by applying different poling conditions

Fabijanić, Ivana; Pervan, Petar; Okorn, Boris; Sancho-Parramon, Jordi; Janicki, Vesna (2020) Ellipsometry-based study of glass refractive index depth profiles obtained by applying different poling conditions. Applied Optics, 59 (5). A69-A74. ISSN 1559-128X

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Abstract

Application of electric field and moderately elevated temperature is depleting the side facing anode from alkali present in glasses. The change of composition of the treated glass results in variation of refractive index depth profile within the treated glass. Spectroscopic ellipsometry is employed for characterization of optical properties of glass treated in different conditions. The results of optical characterization are verified by secondary ion mass spectroscopy. It is found that the refractive index profile obtained from ellipsometry has maximum value higher than the one of untreated glass. Obtained refractive index profiles are in very good agreement with concentration profiles.

Item Type:	Article
Uncontrolled Keywords:	ellipsometry; glass; optical characterization; refractive index inhomogeneity; glass poling
Subjects:	NATURAL SCIENCES > Physics > Condensed Matter Physics
Divisions:	Division of Materials Physics
Projects:	Project title Project leader Project code Project type Razlaganje električnim poljem u tankim optičkim slojevima - nanostrukturiranje, dopiranje, porozni slojevi-REPTOSNANODOPS Vesna Janicki IP-2016-06-2168 HRZZ
Depositing User:	Vesna Janicki
Date Deposited:	30 Apr 2020 06:36
URI:	http://fulir.irb.hr/id/eprint/5602
DOI:	doi.org/10.1364/AO.59.000A69

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