Skukan, N.; Grilj, V.; Sudić, Ivan; Pomorski, M.; Kada, W.; Makino, T.; Kambayashi, Y.; Andoh, Y.; Onoda, S.; Sato, S.; Ohshima, T.; Kamiya, T.; Jakšić, M. (2016) Charge multiplication effect in thin diamond films. Applied Physics Letters, 109 (4). ISSN 0003-6951
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Abstract
Herein, we report on the enhanced sensitivity for the detection of charged particles in single crystal chemical vapour deposition (scCVD) diamond radiation detectors. The experimental results demonstrate charge multiplication in thin planar diamond membrane detectors, upon impact of 18MeV O ions, under high electric field conditions. Avalanche multiplication is widely exploited in devices such as avalanche photo diodes, but has never before been reproducibly observed in intrinsic CVD diamond. Because enhanced sensitivity for charged particle detection is obtained for short charge drift lengths without dark counts, this effect could be further exploited in the development of sensors based on avalanche multiplication and radiation detectors with extreme radiation hardness
| Item Type: | Article |
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| Uncontrolled Keywords: | CVD-diamond ; ionization ; system ; diodes |
| Subjects: | NATURAL SCIENCES > Physics |
| Divisions: | Division of Experimental Physics |
| Depositing User: | Andreo Crnjac |
| Date Deposited: | 11 Mar 2019 09:57 |
| URI: | http://fulir.irb.hr/id/eprint/4457 |
| DOI: | 10.1063/1.4959863 |
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