General approach to reliable characterization of thin metal films

Amotchkina, Tatiana; Janicki, Vesna; Sancho-Parramon, Jordi; Tikhonravov, Alexander V.; Trubetskov, Michael K.; Zorc, Hrvoje (2011) General approach to reliable characterization of thin metal films. Applied Optics, 50 (10). pp. 1453-1464. ISSN 0003-6935

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Abstract

Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.

Item Type:

Article

Additional Information:

This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ao/abstract.cfm?uri=ao-50-10-1453. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Uncontrolled Keywords:

metal films; surface plasmons; ellipsometry; optical characterization

Subjects:

NATURAL SCIENCES > Physics

Divisions:

Division of Laser and Atomic Research and Development

Projects: