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Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy

Siketić, Zdravko; Bogdanović Radović, Ivančica; Jakšić, Milko; Popović Hadžija, Marijana; Hadžija, Mirko (2015) Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy. Applied Physics Letters, 107 . 093702-1. ISSN 0003-6951

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Abstract

In order to better understand biochemical processes inside an individual cell, it is important to measure the molecular composition at the submicron level. One of the promising mass spectrometry imaging techniques that may be used to accomplish this is Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), using MeV energy heavy ions for excitation. MeV ions have the ability to desorb large intact molecules with a yield that is several orders of magnitude higher than conventional SIMS using keV ions. In order to increase the spatial resolution of the MeV TOF-SIMS system, we propose an independent TOF trigger using a STIM (scanning transmission ion microscopy) detector that is placed just behind the thin transmission target. This arrangement is suitable for biological samples in which the STIM detector simultaneously measures the mass distribution in scanned samples. The capability of the MeV TOF-SIMS setup was demonstrated by imaging the chemical composition of CaCo-2 cells.

Item Type: Article
Additional Information: Acknowledgments: We wish to thank Dr. Mira Ristić for the use of the freeze drier and Dr. Ana Šantić for the thin film evaporation equipment. Part of this work was supported by the UKF project “Study of modern paint materials and their stability using MeV SIMS and other analytical techniques,” Croatian Center of Excellence for advanced Materials and Sensing devices (CEMS), and the IAEA CRP project “Development of molecular concentration mapping techniques using MeV focused ion beams.”
Uncontrolled Keywords: MeV-SIMS; STIM; imaging; single cells
Subjects: NATURAL SCIENCES > Physics
Divisions: Division of Experimental Physics
Division of Molecular Medicine
Projects:
Project titleProject leaderProject codeProject type
Znanstveni centar izvrsnosti za napredne materijale i senzore (CEMS)dr. Milko JakšićUNSPECIFIEDFP7
IAEA CRP project “Development of molecular concentration mapping techniques using MeV focused ion beams.”dr. Zdravko SiketićF11019IAEA CRP
Depositing User: Zdravko Siketić
Date Deposited: 08 Dec 2016 13:56
Last Modified: 08 Dec 2016 13:56
URI: http://fulir.irb.hr/id/eprint/3177
DOI: dx.doi.org/10.1063/1.4930062

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