Items where Author is "Čeh, Miran"

Article

Juraić, Krunoslav; Dubček, Pavo; Bohač, Mario; Gajović, Andreja; Bernstorff, Sigrid; Čeh, Miran; Hodzic, Aden; Gracin, Davor (2022) Surface Morphology of Textured Transparent Conductive Oxide Thin Film Seen by Various Probes: Visible Light, X-rays, Electron Scattering and Contact Probe. Materials, 15 (14). ISSN 1996-1944

Juraić, Krunoslav; Plodinec, Milivoj; Kereković, Irena; Meljanac, Daniel; Mandić, Vilko; Gracin, Davor; Janicki, Vesna; Bernstorff, Sigrid; Čeh, Miran; Hodžić, Aden; Gajović, Andreja (2020) Modelling of simultaneously obtained small and wide angle synchrotron-radiation scattering depth profiles of ordered titania nanotube thin films. Materials Chemistry and Physics, 240 . pp. 1-9. ISSN 0254-0584

Buljan Meić, Iva; Kontrec, Jasminka; Domazet Jurašin, Darija; Selmani, Atiđa; Njegić Džakula, Branka; Maltar-Strmečki, Nadica; Lyons, Daniel Mark; Plodinec, Milivoj; Čeh, Miran; Gajović, Andreja; Dutour Sikirić, Maja; Kralj, Damir (2018) How similar are amorphous calcium carbonate and calcium phosphate? A comparative study of amorphous phases formation conditions. Crystengcomm, 20 . pp. 35-50. ISSN 1466-8033

Gracin, Davor; Siketić, Zdravko; Juraić, Krunoslav; Čeh, Miran (2013) Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy. Applied Surface Science, 275 . 19 - 22. ISSN 0169-4332

Juraić, Krunoslav; Gracin, Davor; Šantić, Branko; Meljanac, Daniel; Zorić, Nedeljko; Gajović, Andreja; Dubček, Pavo; Bernstorff, Sigrid; Čeh, Miran (2010) GISAXS and GIWAXS analysis of amorphous–nanocrystalline silicon thin films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 268 (3-4). pp. 259-262. ISSN 0168583X

Unpublished conference/workshop items or lecture materials

Juraić, Krunoslav; Gracin, Davor; Siketić, Zdravko; Čeh, Miran Analysis of amorphous-nanocrystalline silicon thin films by High Resolution Transmission Electron Microscopy and Time-of-Flight Elastic Recoil Detection Analysis. In: Croatian Microscopy Symposium (16 November 2012 - 17 November 2012) Pula. (Unpublished)