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Electronic Properties of a Synthetic Single-Crystal Diamond Exposed to High Temperature and High Radiation

Crnjac, Andreo; Skukan, Natko; Provatas, Georgios; Rodriguez-Ramos, Mauricio; Pomorski, Michal; Jakšić, Milko (2020) Electronic Properties of a Synthetic Single-Crystal Diamond Exposed to High Temperature and High Radiation. Materials, 13 (11). ISSN 1996-1944

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Diamond, as a wide band-gap semiconductor material, has the potential to be exploited under a wide range of extreme operating conditions, including those used for radiation detectors. The radiation tolerance of a single- crystal chemical vapor deposition (scCVD) diamond detector was therefore investigated while heating the device to elevated temperatures. In this way, operation under both high-temperature and high-radiation conditions could be tested simultaneously. To selectively introduce damage in small areas of the detector material, a 5 MeV scanning proton microbeam was used as damaging radiation. The charge collection efficiency (CCE) in the damaged areas was monitored using 2 MeV protons and the ion beam induced charge (IBIC) technique, indicating that the CCE decreases with increasing temperature. This decreasing trend saturates in the temperature range of approximately 660 K, after which CCE recovery is observed. These results suggest that the radiation hardness of diamond detectors deteriorates at elevated temperatures, despite the annealing effects that are also observed. It should be noted that the diamond detector investigated herein retained its very good spectroscopic properties even at an operation temperature of 725 K (≈2% for 2 MeV protons).

Item Type: Article
Uncontrolled Keywords: diamond ; detector ; high-temperature ; ion beam ; radiation damage
Subjects: NATURAL SCIENCES > Physics
Divisions: Division of Experimental Physics
Project titleProject leaderProject codeProject type
Implementation of activities described in the Roadmap to Fusion during Horizon 2020 through a Joint programme of the members of the EUROfusion consortium-EUROfusionUNSPECIFIED633053EK
Center of Excellence for Advanced Materials and Sensing DevicesUNSPECIFIEDKK.
Depositing User: Andreo Crnjac
Date Deposited: 02 Jul 2020 06:59
DOI: 10.3390/ma13112473

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