Mayer, M.; Silva, TF.; Arredondo, R.; Balden, M.; Bogdanović Radović, Ivančica; Höschen, T.; Maier, H.; Oberkofler, M.; Ru, L.; Siketić, Zdravko (2018) Tungsten surface enrichment in EUROFER and Fe-W model systems studied by high-resolution time-of-flight rutherford backscattering spectroscopy. Nuclear Materials and Energy, 17 . pp. 147-151. ISSN 2352-1791
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Abstract
Time-of-flight Rutherford backscattering spectroscopy (ToF-RBS) with incident heavy ions offers a substantially improved depth resolution compared to conventional RBS with incident He ions. The new Garching ToF-RBS detector is located at a scattering angle of 150° with a free flight path of 1.313 m and a time resolution of 600 ps. The experimentally achieved depth resolution at the surface of W-containing Fe samples is 2–3 nm using incident Si ions. Model systems consisting of Fe layers with 0.7, 1.5 and 4.2 at% W and EUROFER steel (containing 0.34 at% W + Ta) were eroded by 200 eV D ions to a fluence of 1023 D/m2 at 310 K and 900 K. W depth profiles were measured using ToF-RBS, light impurities at the surface were detected using time-of-flight elastic recoil detection analysis (ToF-ERDA). The data sets from the two techniques were analyzed self-consistently. In all cases W enrichment at the surface was observed. The enrichment at 310 K is in good agreement with SDTrimSP simulations if the experimentally achieved depth resolution is taken into account. Annealing of the model systems with 0.7 and 1.5 at% W to 900 K for 10 h in vacuum resulted also in a W-enriched surface layer.
Item Type: | Article |
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Uncontrolled Keywords: | Rutherford Backscattering Spectroscopy ; RBS ; ToF-RBS ; Tungsten surface enrichment ; EUROFER ; MultiSIMNRA |
Subjects: | NATURAL SCIENCES > Physics |
Divisions: | Division of Experimental Physics |
Depositing User: | Ivančica Bogdanović Radović |
Date Deposited: | 16 Jul 2019 12:11 |
URI: | http://fulir.irb.hr/id/eprint/4875 |
DOI: | 10.1016/j.nme.2018.10.004 |
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