Determination of deposition order of blue ballpoint pen lines by MeV Secondary Ion Mass Spectrometry

Malloy, Mason C.; Bogdanović Radović, Ivančica; Siketić, Zdravko; Jakšić, Milko (2017) Determination of deposition order of blue ballpoint pen lines by MeV Secondary Ion Mass Spectrometry. Forensic chemistry, 7 . pp. 75-80. ISSN 2468-1709

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Abstract

Secondary Ion Mass Spectrometry using MeV ion excitation was utilised for the analysis of optically indistinguishable intersecting ballpoint pen lines on paper. It was demonstrated that the technique was able to identify different colorants (dyes and synthetic organic pigments) with high efficiency and in a single measurement. The analysis of ink-ink intersections was performed using the Time-of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry. This technique is attached to the heavy ion microprobe at the accelerator facility, and employs focused 8 MeV Si4+ ions for the surface analysis. Molecular imaging allowed for successful identification of sequence deposition order of otherwise optically indistinguishable intersecting lines.

Item Type:	Article
Additional Information:	M.C.M. acknowledges that the project was co-funded by the Erasmus+ programme of the European Union. The European Commission support for the production of this publication does not constitute an endorsement of the contents, which reflects the views only of the authors, and the Commission cannot be held responsible for any use which may be made of the information contained therein. M.C.M. would additionally like to thank Dr. Chris Amodio and Dr. Melanie Bailey of the University of Surrey for their support in this project. I.B.R., Z.S., M.J. acknowledge support by the Croatian Centre of Excellence for Advanced Materials and Sensing devices research unit Ion Beam Physics and Technology, Ruder Boskovic Institute, Zagreb, Croatia. The financial support from the International Atomic Energy Agency through the F11019 Coordinated Research Project on Development of molecular concentration mapping techniques using MeV focused ion beams is acknowledged.
Uncontrolled Keywords:	MeV-SIMS; forensic document examination; intersecting ink lines; heavy ion microprobe; molecular imaging
Subjects:	NATURAL SCIENCES > Physics
Divisions:	Division of Experimental Physics
Depositing User:	Ivančica Bogdanović Radović
Date Deposited:	13 Jul 2018 10:46
URI:	http://fulir.irb.hr/id/eprint/4093
DOI:	10.1016/j.forc.2017.10.004

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