Karlušić, Marko; Fazinić, Stjepko; Siketić, Zdravko; Tonči, Tadić; Cosic, Donny Domagoj; Božičević Mihalić, Iva; Zamboni, Ivana; Jakšić, Milko; Schleberger, Marika (2017) Monitoring Ion Track Formation Using In Situ RBS/c, ToF-ERDA, and HR-PIXE. Materials, 10 (9). p. 1041. ISSN 1996-1944
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Abstract
The aim of this work is to investigate the feasibility of ion beam analysis techniques for monitoring swift heavy ion track formation. First, the use of the in situ Rutherford backscattering spectrometry in channeling mode to observe damage build-up in quartz SiO2 after MeV heavy ion irradiation is demonstrated. Second, new results of the in situ grazing incidence time-of-flight elastic recoil detection analysis used for monitoring the surface elemental composition during ion tracks formation in various materials are presented. Ion tracks were found on SrTiO3, quartz SiO2, a-SiO2, and muscovite mica surfaces by atomic force microscopy, but in contrast to our previous studies on GaN and TiO2, surface stoichiometry remained unchanged. Third, the usability of high resolution particle induced X-ray spectroscopy for observation of electronic dynamics during early stages of ion track formation is shown.
| Item Type: | Article | ||||||||
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| Uncontrolled Keywords: | swift heavy ion; ion track; RBS/c; AFM; ERDA; PIXE | ||||||||
| Subjects: | NATURAL SCIENCES > Physics > Nuclear Physics NATURAL SCIENCES > Physics > Atomic and Molecular Physics NATURAL SCIENCES > Physics > Condensed Matter Physics |
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| Divisions: | Division of Experimental Physics Division of Materials Physics |
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| Depositing User: | Marko Karlušić | ||||||||
| Date Deposited: | 07 Sep 2017 10:44 | ||||||||
| URI: | http://fulir.irb.hr/id/eprint/3561 | ||||||||
| DOI: | 10.3390/ma10091041 |
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