Pavlović, Mladen; Jakšić, Milko; Zorc, Hrvoje; Medunić, Zvonko (2008) Identification of deep trap levels from thermally stimulated current spectra of semi-insulating CdZnTe detector material. Journal of Applied Physics, 104 (2). pp. 23525-1. ISSN 0021-8979
|
PDF
- Published Version
Download (301kB) | Preview |
Abstract
Deep trap levels in the semi-insulating (SI) CdZnTe detector material were characterized by simultaneous multiple peak analysis based on thermally stimulated current (TSC) measurements. In our TSCs that have been published previously electron hole pairs were created through the use of proton beam irradiation. Charge carriers were captured in deep traps and afterward released by thermal emission, which was recorded in the 90–300 K range. We showed that the obtained TSC spectra could be well fitted with a unique set of 14 different deep traps, which were all simultaneously and completely characterized. The obtained trap data are in good accordance with earlier deep trap characterizations of the other authors obtained on similar SI CdZnTe materials using different methods.
| Item Type: | Article | ||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Additional Information: | Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied J. of Physics and may be found at http://scitation.aip.org/content/aip/journal/jap/104/2/10.1063/1.2959354. | ||||||||||||
| Uncontrolled Keywords: | deep levels; deep trap parameters; TSC measurements | ||||||||||||
| Subjects: | NATURAL SCIENCES > Physics NATURAL SCIENCES > Physics > Condensed Matter Physics |
||||||||||||
| Divisions: | Division of Experimental Physics Division of Laser and Atomic Research and Development |
||||||||||||
| Projects: |
|
||||||||||||
| Depositing User: | Hrvoje Zorc | ||||||||||||
| Date Deposited: | 04 May 2015 13:53 | ||||||||||||
| URI: | http://fulir.irb.hr/id/eprint/1775 | ||||||||||||
| DOI: | 10.1063/1.2959354 |
Actions (login required)
 |
View Item |
Altmetric
Altmetric
