hrvatski jezikClear Cookie - decide language by browser settings

GISAXS study of Si nanostructures in SiO2 matrix for solar cell applications

Pivac, Branko; Dubček, Pavo; Capan, Ivana; Zorc, Hrvoje; Dasović, Jasna; Bernstorff, Sigrid; Wu, Marvin; Vlahović, Branislav (2013) GISAXS study of Si nanostructures in SiO2 matrix for solar cell applications. physica status solidi (a), 210 (4). pp. 755-759. ISSN 1862-6300

| Request a personal copy from author

Abstract

We explore the process of Si nanoparticles formation in SiO2 matrix suitable for advanced solar cells application. To this purpose a superstructure consisting of alternating 5 nm thick SiOx and SiO2 layers was deposited by high vacuum evaporation from solid sources. After high temperature annealing of such structures in high vacuum, the SiOx decomposed and Si nanoparticles aggregated at their former position forming therefore a superstructure of Si nanoparticles embedded in dielectric SiO2 matrix. To explore such process of nanoobjects formation in different matrix, grazing incidence small-angle X-ray scattering (GISAXS) seems to be as relatively easy non-destructive technique ; a logical choice. Despite the fact that due to the rather small difference in electron density between Si and SiO2. GISAXS contrast is very small, by performing GISAXS with intense synchrotron light and subtracting the dominant surface contribution to the overall signal we managed to retrieve information on the structural changes within the layers. The conclusions from the GISAXS analysis were confirmed by photoluminescence measurements.

Item Type: Article
Uncontrolled Keywords: photoluminescence; Si nanostructures; SiOx/SiO2 superlattice; small angle X-ray scattering
Subjects: NATURAL SCIENCES > Physics
NATURAL SCIENCES > Physics > Condensed Matter Physics
Divisions: Division of Laser and Atomic Research and Development
Division of Materials Physics
Projects:
Project titleProject leaderProject codeProject type
Optička svojstva nanostrukturnih slojeva[119546] Hrvoje Zorc098-0000000-3191MZOS
Temeljna svojstva nanostruktura i defekata u poluvodičima i dielektricima[67912] Branko Pivac098-0982886-2866MZOS
Depositing User: Hrvoje Zorc
Date Deposited: 19 May 2015 14:31
Last Modified: 19 May 2015 14:31
URI: http://fulir.irb.hr/id/eprint/1762
DOI: 10.1002/pssa.201200527

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year