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Metal island film-based structures for sensing using spectrophotometry and ellipsometry

Janicki, Vesna; Sancho-Parramon, Jordi; Bosch, Salvador; Zorc, Hrvoje; Belarre, Francesc; Arbiol, Jordi (2014) Metal island film-based structures for sensing using spectrophotometry and ellipsometry. Applied Physics A, 115 (2). pp. 481-486. ISSN 0947-8396

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Abstract

Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.

Item Type: Article
Additional Information: The final publication is available at http://link.springer.com/article/10.1007/s00339-013-8056-x.
Uncontrolled Keywords: thin films, sensors, surface plasmon resonsnce, nanocomposites, metal island films
Subjects: NATURAL SCIENCES > Physics
Divisions: Division of Laser and Atomic Research and Development
Projects:
Project titleProject leaderProject codeProject type
Optička svojstva nanostrukturnih slojeva[119546] Hrvoje Zorc098-0000000-3191MZOS
Depositing User: Vesna Janicki
Date Deposited: 11 Nov 2014 13:05
Last Modified: 11 Nov 2014 13:05
URI: http://fulir.irb.hr/id/eprint/1594
DOI: 10.1007/s00339-013-8056-x

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