Oscillations in spectral behavior of total losses (1−R−T) in thin dielectric films

Amotchkina, Tatiana; Trubetskov, M.K.; Tikhonravov, A.V.; Janicki, Vesna; Sancho-Parramon, Jordi; Razskazovskaya, O.; Pervak, V. (2012) Oscillations in spectral behavior of total losses (1−R−T) in thin dielectric films. Optics Express, 20 (14). pp. 16129-16144. ISSN 1094-4087

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Abstract

We explain reasons of oscillations frequently observed in total losses spectra (1−R−T) calculated on the basis of measurement spectral photometric data of thin film samples. The first reason of oscillations is related to difference in angles of incidence at which spectral transmittance and reflectance are measured. The second reason is an absorption in a thin film. The third reason is a slight thickness non-uniformity of the film. We observe a good agreement between theoretical models and corresponding measurements, which proves above statements on the origins of oscillations in total losses.

Item Type:

Article

Additional Information:

This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/oe/fulltext.cfm?uri=oe-20-14-16129&id=239460. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Uncontrolled Keywords:

materials and process characterization; interference coatings; thin films; optical properties; deposition and fabrication

Subjects:

NATURAL SCIENCES > Physics

Divisions:

Division of Laser and Atomic Research and Development

Projects: