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Amotchkina, Tatiana; Janicki, Vesna; Sancho-Parramon, Jordi; Tikhonravov, Alexander V.; Trubetskov, Michael K.; Zorc, Hrvoje (2011) General approach to reliable characterization of thin metal films. Applied Optics, 50 (10). pp. 1453-1464. ISSN 0003-6935