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Stachura, R.; Kubala-Kukuś, A.; Banaś, D.; Stabrawa, I.; Szary, K.; Jagodziński, P.; Aquilanti, G.; Božičević Mihalić, Iva; Pajek, M.; Semaniak, J.; Teodorczyk, M. (2020) Application of synchrotron radiation based X-ray reflectometry in analysis of TiO2 nanolayers, unmodified and irradiated with Xeq+ Ions. Acta Physica Polonica. A, 137 (1). pp. 38-43. ISSN 0587-4246