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Masetti, Enrico; Bulir, Jiri; Gagliardi, Serena; Janicki, Vesna; Krasilnikova, Anna; Di Santo, G.; Coluzza, C. (2004) Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films. Thin Solid Films, 455 . pp. 468-472. ISSN 0040-6090