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Božičević Mihalić, Iva; Fazinić, Stjepko; Tadić, Tonči; Jakšić, Milko; Čosić, Domagoj (2016) Study of ion beam induced chemical effects in silicon with a downsized high resolution X-ray spectrometer for use with focused ion beams. Journal of Analytical Atomic Spectrometry, 31 (11). pp. 2293-2304. ISSN 0267-9477