Feng, Jiandong; Deschout, Hendrik; Caneva, Sabina; Hofmann, Stephan; Lončarić, Ivor; Lazić, Predrag; Radenovic, Aleksandra (2018) Imaging of Optically Active Defects with Nanometer Resolution. Nano Letters, 18 (3). pp. 1739-1744. ISSN 1530-6984
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Abstract
Point defects significantly influence the optical and electrical properties of solid-state materials due to their interactions with charge carriers, which reduce the band-to-band optical transition energy. There has been a demand for developing direct optical imaging methods that would allow in situ characterization of individual defects with nanometer resolution. Here, we demonstrate the localization and quantitative counting of individual optically active defects in monolayer hexagonal boron nitride using single molecule localization microscopy. By exploiting the blinking behavior of defect emitters to temporally isolate multiple emitters within one diffraction limited region, we could resolve two defect emitters with a point-to-point distance down to ten nanometers. The results and conclusion presented in this work add unprecedented dimensions toward future applications of defects in quantum information processing and biological imaging.
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| Additional Information: | This work was financially supported by Swiss National Science Foundation SNSF (200021 153653). We thank the Centre Interdisciplinaire de Microscopie Electronique (CIME) at the Ecole Polytechnique federale de Lausanne (EPFL) for access to electron microscopes, Ke Liu, Davide Deiana, and Duncan T. L. Alexander for TEM imaging. Device fabrication was partially carried out at the EPFL Center for Micro/Nanotechnology (CMi). Special thanks to Martina Lihter for hBN transfer and Tomas Lukes for bSOFI image analysis of which results are given in Figure S9. The work performed in Cambridge was supported by the EPSRC Cambridge NanoDTC, EP/L015978/1. I. L. and P. L. were supported by the Unity Through Knowledge Fund, Contract No. 22/15 and H2020 CSA Twinning Project No. 692194, RBI-T-WINNING. | ||||||||||||
| Uncontrolled Keywords: | super resolution microscopy; boron nitride monolayer; point defects; localization microscopy | ||||||||||||
| Subjects: | NATURAL SCIENCES > Physics NATURAL SCIENCES > Physics > Condensed Matter Physics |
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| Divisions: | Theoretical Physics Division | ||||||||||||
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| Depositing User: | Ivor Lončarić | ||||||||||||
| Date Deposited: | 20 Nov 2019 15:50 | ||||||||||||
| URI: | http://fulir.irb.hr/id/eprint/5095 | ||||||||||||
| DOI: | 10.1021/acs.nanolett.7b04819 |
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Imaging of Optically Active Defects with Nanometer Resolution (deposited 19 Nov 2019 12:07)
- Imaging of Optically Active Defects with Nanometer Resolution (deposited 20 Nov 2019 15:50) [Currently Displayed]
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