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Optical and non-optical characterization of Nb2O5-SiO2 compositional graded-index layers and rugate structures

Leitel, Robert; Stenzel, Olaf; Wilbrandt, Steffen; Gaebler, Dieter; Janicki, Vesna; Kaiser, Norbert (2006) Optical and non-optical characterization of Nb2O5-SiO2 compositional graded-index layers and rugate structures. Thin Solid Films, 497 (1-2). pp. 135-141. ISSN 0040-6090

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Abstract

The deposition of graded-index layers and rugate structures was performed by coevaporation of silicon dioxide as the low index material and niobium pentoxide as the high index material. To obtain information about the composition depth profile of the films, we used cross-sectional transmission electron microscopy to supplement deposition rate data recorded by two indipendent crystal quartz monitors during film preparation. The concentration depth profile was transformed to a refractive index profile using the effective medium approximation. The thus obtained refractive index profiles turned out to represent efficient initial approximations for re-engineering purposes.

Item Type: Article
Uncontrolled Keywords: physical vapour deposition, rugate, gradient index, niobium pentoxide, silicon dioxide
Subjects: NATURAL SCIENCES > Physics
Divisions: Division of Laser and Atomic Research and Development
Depositing User: Vesna Janicki
Date Deposited: 11 Nov 2014 12:24
Last Modified: 11 Nov 2014 12:24
URI: http://fulir.irb.hr/id/eprint/1590
DOI: 10.1016/j.tsf.2005.10.064

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